{"id":11,"date":"2021-08-26T10:09:55","date_gmt":"2021-08-26T01:09:55","guid":{"rendered":"https:\/\/inoue.ynu.ac.jp\/?page_id=11"},"modified":"2026-09-07T11:32:41","modified_gmt":"2026-09-07T02:32:41","slug":"projects","status":"publish","type":"page","link":"https:\/\/inoue.ynu.ac.jp\/en\/projects\/","title":{"rendered":"Projects"},"content":{"rendered":"<p><\/p>\n<h1>Ongoing Projects<\/h1>\n<h2>Collaborative Research<\/h2>\n<p>Imec (Belgium)<\/p>\n<p>Overseas Device Manufacturers<\/p>\n<p>Semiconductor Equipment Manufacturers<\/p>\n<p>Semiconductor Materials Manufacturers<\/p>\n<p>National Institute of Advanced Industrial Science and Technology (AIST)<\/p>\n<p>Numerous Domestic Universities<\/p>\n<h2>Competitive Research Funding<\/h2>\n<ul>\n<li>JST Research and Development Program for Next-generation Edge AI Semiconductors 2025-2030<\/li>\n<li>JST Strategic Basic Research Programs (PRESTO) 2022-2026<\/li>\n<li>JST A-STEP industry-university cooperation Stage II (Full-scale phase) 2024-2029<\/li>\n<li>JSPS Grant-in-Aid for Scientific Research (B) 2023-2026<\/li>\n<li>NEDO Post-5G Information and Communication System Development Project \/ Advanced Semiconductor Manufacturing Technology Development<\/li>\n<li>NEDO Intensive Support Program for Young Promising Researchers \/ Joint Research Phase (Company Personnel Doctoral Dispatch Type)<\/li>\n<li>Private Collaborative Research Grants: Large-Scale Joint Research 2022-2025 (over 15 million yen annually, large-scale joint research with a major semiconductor equipment manufacturer)<\/li>\n<li>International (Trilateral) Joint Development Project 2022-2024, 2024-2026<\/li>\n<\/ul>\n<h2>Laboratory Equipment<\/h2>\n<p><span style=\"color: #0000ff;\"><strong>Advanced Semiconductor Evaluation Equipment<\/strong><\/span><\/p>\n<p>EM Measurement Equipment<br \/>\nTDDB Measurement System (300mm Wafer Full-Auto Prober)<\/p>\n<p>&nbsp;<\/p>\n<p><span style=\"color: #0000ff;\"><strong>300mm Wafer Capability<\/strong><\/span><\/p>\n<p>Bonding Strength Measurement System under Inert Atmosphere<br \/>\nUltrasonic Microscope (SAM)<br \/>\nReflow Oven<br \/>\nFilm Thickness Measurement Equipment<br \/>\nSurface Contact Angle, Surface Energy Measurement Equipment<br \/>\n4-point Prober<br \/>\nPlasma Cleaner<br \/>\nBond Wave<\/p>\n<p>&nbsp;<\/p>\n<p><span style=\"color: #0000ff;\"><strong>Evaluation Equipment<\/strong><\/span><\/p>\n<table style=\"border-collapse: collapse; width: 100%; height: 356px;\">\n<tbody>\n<tr style=\"height: 49px;\">\n<td style=\"width: 39.4386%; text-align: center; height: 49px;\"><strong><span style=\"color: #000000;\">Mechanical Testing Room<\/span><\/strong><\/td>\n<td style=\"width: 39.5437%; text-align: center; height: 49px;\"><strong>Chemical Testing Room<\/strong><\/td>\n<td style=\"width: 21.0176%; height: 49px;\"><\/td>\n<\/tr>\n<tr style=\"height: 49px;\">\n<td style=\"width: 39.4386%; height: 49px;\">Nano Indenter<\/td>\n<td style=\"width: 39.5437%; height: 49px;\">CMP Equipment<\/td>\n<td style=\"width: 21.0176%; height: 49px;\"><\/td>\n<\/tr>\n<tr style=\"height: 49px;\">\n<td style=\"width: 39.4386%; height: 49px;\">4-point\/3-point Bending Test Equipment<\/td>\n<td style=\"width: 39.5437%; height: 49px;\">4-point\/3-point Bending Test Equipment<\/td>\n<td style=\"width: 21.0176%; height: 49px;\"><\/td>\n<\/tr>\n<tr style=\"height: 49px;\">\n<td style=\"width: 39.4386%; height: 49px;\"><\/td>\n<td style=\"width: 39.5437%; height: 49px;\">Zeta Potential Measurement Equipment<\/td>\n<td style=\"width: 21.0176%; height: 49px;\"><\/td>\n<\/tr>\n<tr style=\"height: 49px;\">\n<td style=\"width: 39.4386%; height: 49px;\"><\/td>\n<td style=\"width: 39.5437%; height: 49px;\">Potentiostat<\/td>\n<td style=\"width: 21.0176%; height: 49px;\"><\/td>\n<\/tr>\n<tr style=\"height: 49px;\">\n<td style=\"width: 39.4386%; height: 52px;\"><\/td>\n<td style=\"width: 39.5437%; height: 52px;\">Rotating Electrode<\/td>\n<td style=\"width: 21.0176%; height: 52px;\"><\/td>\n<\/tr>\n<tr style=\"height: 49px;\">\n<td style=\"width: 39.4386%; height: 10px;\"><\/td>\n<td style=\"width: 39.5437%; height: 10px;\">Dynamic Electrochemical Measurement System<\/td>\n<td style=\"width: 21.0176%; height: 10px;\"><\/td>\n<\/tr>\n<tr style=\"height: 49px;\">\n<td style=\"width: 39.4386%; height: 49px;\"><\/td>\n<td style=\"width: 39.5437%; height: 49px;\">Post-CMP Cleaning Equipment<\/td>\n<td style=\"width: 21.0176%; height: 49px;\"><\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>Other ongoing updates.<\/p>\n<p>&nbsp;<\/p>","protected":false},"excerpt":{"rendered":"<p>Ongoing Projects Collaborative Research Imec (Belgium) Overseas Device Manufacturers Semiconductor Equipment Manufacturers Semiconductor Materials Manufacturers National Institute of Advanced Industrial Science and Technology (AIST) Numerous Domestic Universities Competitive Research Funding JST Research and Development Program for Next-generation Edge AI Semiconductors 2025-2030 JST Strategic Basic Research Programs (PRESTO) 2022-2026 JST A-STEP industry-university cooperation Stage II (Full-scale [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":4,"comment_status":"closed","ping_status":"closed","template":"","meta":{"sns_share_botton_hide":"","vkExUnit_sns_title":"","_veu_custom_css":"","veu_display_promotion_alert":"common","_exclude_from_list_pages":"","footnotes":""},"class_list":["post-11","page","type-page","status-publish","hentry"],"veu_head_title_object":{"title":"","add_site_title":""},"_links":{"self":[{"href":"https:\/\/inoue.ynu.ac.jp\/en\/wp-json\/wp\/v2\/pages\/11","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/inoue.ynu.ac.jp\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/inoue.ynu.ac.jp\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/inoue.ynu.ac.jp\/en\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/inoue.ynu.ac.jp\/en\/wp-json\/wp\/v2\/comments?post=11"}],"version-history":[{"count":69,"href":"https:\/\/inoue.ynu.ac.jp\/en\/wp-json\/wp\/v2\/pages\/11\/revisions"}],"predecessor-version":[{"id":1131,"href":"https:\/\/inoue.ynu.ac.jp\/en\/wp-json\/wp\/v2\/pages\/11\/revisions\/1131"}],"wp:attachment":[{"href":"https:\/\/inoue.ynu.ac.jp\/en\/wp-json\/wp\/v2\/media?parent=11"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}